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Submitted by Jean Lapointe to the annual micrography contest of the International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN).
Click for larger image
Submitted by Jean Lapointe to the annual micrography contest of the International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN).
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